In this paper, a new method is proposed in order to evaluate the stochastic solution of linear random differential equation. The method is based on the combination of the probabili...
— In this paper, a new method is proposed to evaluate the reliability of stochastic mechanical systems. This technique is based on the combination of the probabilistic transforma...
Secret or private information may be leaked to an external attacker through the timing behaviour of the system running the untrusted code. After introducing a formalisation of thi...
Alessandra Di Pierro, Chris Hankin, Igor Siveroni,...
Hot-carrier eects and electromigration are the two important failure mechanisms that signicantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...
— Although efficient processing of probabilistic databases is a well-established field, a wide range of applications are still unable to benefit from these techniques due to t...