At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
Li Chen, Sujit Dey, Pablo Sanchez, Krishna Sekar, ...
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
Li Chen, Srivaths Ravi, Anand Raghunathan, Sujit D...
Three-dimensional (3-D) integrated circuits have emerged as promising candidates to overcome the interconnect bottlenecks of nanometer scale designs. While they offer several othe...
Gian Luca Loi, Banit Agrawal, Navin Srivastava, Sh...
With the explosive growth of Web and the recent development in digital media technology, the number of images on the Web has grown tremendously. Consequently, Web image clustering...