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TCAD
2008
93views more  TCAD 2008»
14 years 9 months ago
Chip Optimization Through STI-Stress-Aware Placement Perturbations and Fill Insertion
Starting at the 65-nm node, stress engineering to improve the performance of transistors has been a major industry focus. An intrinsic stress source--shallow trench isolation (STI)...
Andrew B. Kahng, Puneet Sharma, Rasit Onur Topalog...
DAC
2009
ACM
15 years 4 months ago
Yield-driven iterative robust circuit optimization algorithm
This paper proposes an equation-based multi-scenario iterative robust optimization methodology for analog/mixed-signal circuits. We show that due to local circuit performance mono...
Yan Li, Vladimir Stojanovic
CIKM
2010
Springer
14 years 6 months ago
A late fusion approach to cross-lingual document re-ranking
The field of information retrieval still strives to develop models which allow semantic information to be integrated in the ranking process to improve performance in comparison to...
Dong Zhou, Séamus Lawless, Jinming Min, Vin...
IDEAL
2005
Springer
15 years 3 months ago
Patterns in Complex Systems Modeling
The design, development, and use of complex systems models raises a unique class of challenges and potential pitfalls, many of which are commonly recurring problems. Over time, res...
Janet Wiles, James Watson
DAC
2007
ACM
15 years 1 months ago
Statistical Framework for Technology-Model-Product Co-Design and Convergence
This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical...
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol...