At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
Jayashree Saxena, Kenneth M. Butler, Vinay B. Jaya...
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...
Charles E. Stroud, Keshia N. Leach, Thomas A. Slau...
A visualisation system that deals with two modalities of information – numerical and textual – is presented. The current application domain is that of prediction in financial ...
In this paper a review of development of manpower in VLSI in India is attempted. In the last decade of the 20th Century, rapid strides have been done in Micro-Electronics in India...
Before Feature Reduction System (FRS) was developed, software engineers were required to use multiple independent web-based information-reporting systems when conducting multiple ...
Hoh Peter In, Thomas Foster, Jason Surprise, Sung-...