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» Causality based generation of directed test cases
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57
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ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 4 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha
MTV
2006
IEEE
98views Hardware» more  MTV 2006»
15 years 6 months ago
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
Heon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy...
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
15 years 6 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
79
Voted
ICSE
2009
IEEE-ACM
15 years 4 months ago
Experiments on the Test Case Length in Specification Based Test Case Generation
Gordon Fraser, Angelo Gargantini
75
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FM
2001
Springer
101views Formal Methods» more  FM 2001»
15 years 4 months ago
Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System
Laurent Arditi, Hédi Boufaïed, Arnaud ...