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» Causality based generation of directed test cases
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ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 2 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha
MTV
2006
IEEE
98views Hardware» more  MTV 2006»
15 years 3 months ago
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
Heon-Mo Koo, Prabhat Mishra, Jayanta Bhadra, Magdy...
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
15 years 4 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...