170 search results - page 10 / 34 » Challenges in Embedded Memory Design and Test |
157
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CASES
2007
ACM
15 years 7 months ago
2007
ACM
Dynamic binary translation (DBT) has been used to achieve numerous goals (e.g., better performance) for general-purpose computers. Recently, DBT has also attracted attention for e...
137
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CODES
2008
IEEE
15 years 5 months ago
2008
IEEE
The capacity of flash-memory storage systems grows at a speed similar to many other storage systems. In order to properly manage the product cost, vendors face serious challenges ...
113
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DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
— Embedded multiprocessors pose new challenges in the design and implementation of embedded software. This has led to the need for programming interfaces that expose the capabili...
121
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GLVLSI
2006
IEEE
15 years 9 months ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
150
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ITC
2003
IEEE
15 years 8 months ago
2003
IEEE
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...