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» Challenges in Embedded Memory Design and Test
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LCTRTS
2009
Springer
15 years 6 months ago
Software transactional memory for multicore embedded systems
Embedded systems, like general-purpose systems, can benefit from parallel execution on a symmetric multicore platform. Unfortunately, concurrency issues present in general-purpos...
Jennifer Mankin, David R. Kaeli, John Ardini
MSE
2005
IEEE
133views Hardware» more  MSE 2005»
15 years 5 months ago
Embedded System Design with FPGAs Using HDLs (Lessons Learned and Pitfalls to Be Avoided)
This paper describes the authors experience with teaching VHDL (and more recently, Verilog) to undergraduate and graduate students at WPI and to engineers through various short co...
R. James Duckworth
ITC
1998
IEEE
94views Hardware» more  ITC 1998»
15 years 4 months ago
Testing embedded-core based system chips
Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design, in which every circuit is designed from scratch and reuse...
Yervant Zorian, Erik Jan Marinissen, Sujit Dey
ERSA
2010
159views Hardware» more  ERSA 2010»
14 years 9 months ago
Acceleration of FPGA Fault Injection Through Multi-Bit Testing
SRAM-based FPGA devices are an attractive option for data processing on space-based platforms, due to high computational capabilities and a lower power envelope than traditional pr...
Grzegorz Cieslewski, Alan D. George, Adam Jacobs
ITC
2003
IEEE
116views Hardware» more  ITC 2003»
15 years 5 months ago
BIST for Deep Submicron ASIC Memories with High Performance Application
Today’s ASIC designs consist of more memory in terms of both area and number of instances. The shrinking of geometries has an even greater effect upon memories due to their tigh...
Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Ome...