204 search results - page 12 / 41 » Circuit power estimation using pattern recognition technique... |
DAC
1994
ACM
15 years 2 months ago
1994
ACM
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
MR
2007
14 years 9 months ago
2007
Electronic Prognostics (EP) is a technique used in high-reliability and high-availability systems to actively and proactively detect faults, allowing the reduction of system downt...
DAC
1996
ACM
15 years 2 months ago
1996
ACM
A novel methodology for circuit design and automatic layout generation is proposed for a class of mixed-signal circuits in presence of layout parasitics and substrate induced nois...
SSPR
2010
Springer
14 years 8 months ago
2010
Springer
Abstract. In this paper we introduce a new approach aimed at solving the problem of image retrieval from text queries. We propose to estimate the word relevance of an image using a...
VTS
2008
IEEE
15 years 4 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...