12 search results - page 1 / 3 » CodSim -- A Combined Delay Fault Simulator |
DFT
2003
IEEE
13 years 11 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...
VLSID
1996
IEEE
13 years 10 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...
CSREASAM
2007
13 years 7 months ago
2007
— In this paper, we present a strategy to detect an intrusion using fault localization tools. We propose an intrusion detection system to detect a self-contained in-band wormhole...
ATS
2010
IEEE
13 years 4 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...