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VTS
2008
IEEE
15 years 3 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
GECCO
2010
Springer
15 years 2 months ago
2010
Springer
The Spidergon interconnection network has become popular recently in multiprocessor systems on chips. To the best of our knowledge, algorithms for collective communications (CC) h...
100
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CP
2001
Springer
15 years 1 months ago
2001
Springer
Abstract. Selecting conformations for side-chains is an important subtask in building three-dimensional protein models. Side-chain placement is a difficult problem because of the l...
AI
1998
Springer
15 years 1 months ago
1998
Springer
We present ELEM2, a new method for inducing classification rules from a set of examples. The method employs several new strategies in the induction and classification processes to ...
117
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IJDMMM
2008
14 years 9 months ago
2008
: Combining multiple data sources, each with its own features, to achieve optimal inference has received a lot of attention in recent years. In inference from multiple data sources...