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133
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CISIM
2008
IEEE
15 years 11 months ago
2008
IEEE
Multiprocessors have emerged as a powerful computing means for running real-time applications, especially where a uniprocessor system would not be sufficient enough to execute all...
114
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DFT
2008
IEEE
15 years 11 months ago
2008
IEEE
VLSI circuits in nanometer VLSI technology experience significant aging effects, which are embodied by performance degradation over operation time. Although this degradation can b...
144
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ISVLSI
2008
IEEE
15 years 11 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
118
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VTC
2008
IEEE
15 years 11 months ago
2008
IEEE
— Recently, we proposed a random transmit power control (TPC) to increase the uplink capacity of DS-CDMA wireless packet access using Rake combining. Furthermore, we evaluated th...
140
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VTS
2008
IEEE
15 years 11 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...