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106
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ISCAS
2006
IEEE
15 years 10 months ago
2006
IEEE
—In this paper, we propose a cost-effective and low-power 64-point fast Fourier transform (FFT)/inverse FFT (IFFT) architecture and chip adopting the retrenched 8-point FFT/IFFT ...
181
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MTDT
2006
IEEE
15 years 10 months ago
2006
IEEE
This paper highlights the cell current characterization of a low leakage 6T SRAM by adjusting the threshold voltages of the transistors in the memory array to reduce the standby p...
182
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VTS
2006
IEEE
15 years 10 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
129
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DATE
2005
IEEE
15 years 10 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
140
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DATE
2005
IEEE
15 years 10 months ago
2005
IEEE
With the scaling of technology and higher requirements on performance and functionality, power dissipation is becoming one of the major design considerations in the development of...