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PODS
2011
ACM
14 years 21 days ago
2011
ACM
Complex Event Processing (CEP) Systems are stream processing systems that monitor incoming event streams in search of userspecified event patterns. While CEP systems have been ad...
DFT
2009
IEEE
15 years 4 months ago
2009
IEEE
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
COLCOM
2009
IEEE
15 years 2 months ago
2009
IEEE
Abstract—For a complex distributed system to be dependable, it must be continuously monitored, so that its failures and imperfections can be discovered and corrected in a timely ...
ET
2002
14 years 9 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
Presentation
Presented at First Electrical Science Divisional Symposium, Indian Institute of Science.
This is joint work with Prof David Parkes, Harvard University.