565 search results - page 23 / 113 » Compositional dynamic test generation |
107
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GECCO
2008
Springer
15 years 3 months ago
2008
Springer
There has been little attention to search based test data generation in the presence of pointer inputs and dynamic data structures, an area in which recent concolic methods have e...
104
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CEC
2005
IEEE
15 years 7 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
ISCAS
2003
IEEE
15 years 7 months ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...
138
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CVPR
2011
IEEE
14 years 10 months ago
2011
IEEE
We present a novel approach to representing and recognizing composite video events. A composite event is specified by a scenario, which is based on primitive events and their tem...
135
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ASE
2004
15 years 1 months ago
2004
TestEra is a framework for automated specification-based testing of Java programs. TestEra requires as input a Java method (in sourcecode or bytecode), a formal specification of th...