397 search results - page 27 / 80 » Computer aided architectural design: Wayfinding complexity a... |
108
click to vote
DAC
2009
ACM
16 years 4 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
109
click to vote
DAC
1996
ACM
15 years 7 months ago
1996
ACM
Abstract-An efficient full-wave electromagnetic analysis tool would be useful in many aspects of engineering design. Development of integral-equation based tools has been hampered ...
107
click to vote
DAC
2007
ACM
15 years 7 months ago
2007
ACM
With the continuous increase of circuit density, interconnect length, and aspect ratio, the influence of capacitive and inductive coupling on timing characteristics of integrated ...
119
click to vote
DAC
2003
ACM
16 years 4 months ago
2003
ACM
Early power analysis for systems-on-chip (SoC) is crucial for determining the appropriate packaging and cost. This early analysis commonly relies on evaluating power formulas for ...
224
click to vote
DAC
2011
ACM
14 years 3 months ago
2011
ACM
Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation te...