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80
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DAC
2009
ACM
16 years 20 days ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
112
Voted
DAC
2007
ACM
16 years 19 days ago
A Self-Tuning Configurable Cache
The memory hierarchy of a system can consume up to 50% of microprocessor system power. Previous work has shown that tuning a configurable cache to a particular application can red...
Ann Gordon-Ross, Frank Vahid
84
Voted
DAC
2007
ACM
16 years 19 days ago
Confidence Scalable Post-Silicon Statistical Delay Prediction under Process Variations
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
Qunzeng Liu, Sachin S. Sapatnekar
DAC
2004
ACM
16 years 19 days ago
A method for correcting the functionality of a wire-pipelined circuit
As across-chip interconnect delays can exceed a clock cycle, wire pipelining becomes essential in high performance designs. Although it allows higher clock frequencies, it may cha...
Vidyasagar Nookala, Sachin S. Sapatnekar
DAC
2006
ACM
16 years 19 days ago
DAG-aware AIG rewriting a fresh look at combinational logic synthesis
This paper presents a technique for preprocessing combinational logic before technology mapping. The technique is based on the representation of combinational logic using And-Inve...
Alan Mishchenko, Satrajit Chatterjee, Robert K. Br...