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ET
2006
120views more  ET 2006»
15 years 3 months ago
Automatic Test Pattern Generation for Resistive Bridging Faults
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...
Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...
CAV
2010
Springer
179views Hardware» more  CAV 2010»
15 years 7 months ago
Generating Litmus Tests for Contrasting Memory Consistency Models
Well-defined memory consistency models are necessary for writing correct parallel software. Developing and understanding formal specifications of hardware memory models is a chal...
Sela Mador-Haim, Rajeev Alur, Milo M. K. Martin
ALENEX
2001
151views Algorithms» more  ALENEX 2001»
15 years 4 months ago
The Asymmetric Traveling Salesman Problem: Algorithms, Instance Generators, and Tests
The purpose of this paper is to provide a preliminary report on the rst broad-based experimental comparison of modern heuristics for the asymmetric traveling salesmen problem ATSP....
Jill Cirasella, David S. Johnson, Lyle A. McGeoch,...
PDSE
1998
126views more  PDSE 1998»
15 years 4 months ago
Validation and Test Generation for Object-Oriented Distributed Software
The development of correct OO distributed software is a daunting task as soon as the distributed interactions are not trivial. This is due to the inherent complexity of distribute...
Thierry Jéron, Jean-Marc Jézé...
CSB
2003
IEEE
15 years 8 months ago
Group Testing With DNA Chips: Generating Designs and Decoding Experiments
DNA microarrays are a valuable tool for massively parallel DNA-DNA hybridization experiments. Currently, most applications rely on the existence of sequence-specific oligonucleot...
Alexander Schliep, David C. Torney, Sven Rahmann