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» Concurrent Test Generation
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96
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ISSRE
2008
IEEE
15 years 9 months ago
RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
Ben Breech, Lori L. Pollock, John Cavazos
91
Voted
KBSE
2008
IEEE
15 years 9 months ago
Heuristics for Scalable Dynamic Test Generation
Jacob Burnim, Koushik Sen