4299 search results - page 139 / 860 » Concurrent Test Generation |
162
Voted
HPDC
2006
IEEE
15 years 9 months ago
2006
IEEE
The aIOLi project aims at optimizing the I/O accesses within the cluster by providing a simple POSIX API, thus avoiding the constraints to use a dedicated parallel I/O library. Th...
146
Voted
KES
2000
Springer
15 years 7 months ago
2000
Springer
This paper presents an open, concurrent model of adaptive hypermedia all its functionality and data are completely distributed on a web of autonomous actors. The model that enable...
154
Voted
SIGSOFT
2006
ACM
15 years 9 months ago
2006
ACM
Unit test cases are focused and efficient. System tests are effective at exercising complex usage patterns. Differential unit tests (DUT) are a hybrid of unit and system tests. T...
148
Voted
ASE
2004
15 years 3 months ago
2004
TestEra is a framework for automated specification-based testing of Java programs. TestEra requires as input a Java method (in sourcecode or bytecode), a formal specification of th...
281
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ATS
2010
IEEE
15 years 1 months ago
2010
IEEE
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...