4299 search results - page 160 / 860 » Concurrent Test Generation |
107
Voted
ICCD
2004
IEEE
16 years 15 days ago
2004
IEEE
Functional verification of systems is aimed at validating the integration of previously verified components. It deals with complex designs, and invariably suffers from scarce re...
130
Voted
DFT
2006
IEEE
15 years 9 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
135
Voted
DSD
2007
IEEE
15 years 10 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
119
Voted
ATS
2003
IEEE
15 years 9 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
102
Voted
ATS
2003
IEEE
15 years 9 months ago
2003
IEEE
Domain testing is a well-known software testing technique. Although research tasks have been initiated in domain testing, automatic test data generation based on character string ...