4299 search results - page 188 / 860 » Concurrent Test Generation |
135
Voted
ICCAD
2000
IEEE
15 years 8 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
128
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SIGSOFT
2009
ACM
15 years 10 months ago
2009
ACM
An objective of unit testing is to achieve high structural coverage of the code under test. Achieving high structural coverage of object-oriented code requires desirable method-ca...
133
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ERLANG
2008
ACM
15 years 5 months ago
2008
ACM
Current and future trends for software include increasingly complex requirements on interaction between systems. As a result, the difficulty of system testing increases. Model-bas...
102
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DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI ...
115
Voted
VTS
1999
IEEE
15 years 8 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...