4299 search results - page 210 / 860 » Concurrent Test Generation |
110
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DDECS
2007
IEEE
15 years 10 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
126
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ICALT
2007
IEEE
15 years 10 months ago
2007
IEEE
In this study, we design and prototype an automatic quiz generation system (auto-quiz for short) for a given English text to test learner comprehension of text content and English...
139
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CNSR
2005
IEEE
15 years 9 months ago
2005
IEEE
In this paper, a modeling and simulation framework is proposed for generating data for training and testing intrusion detection systems. The framework can develop models of web us...
129
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NIPS
2007
15 years 5 months ago
2007
The present work aims to model the correspondence between facial motion and speech. The face and sound are modelled separately, with phonemes being the link between both. We propo...
123
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VLSID
1996
IEEE
15 years 8 months ago
1996
IEEE
W epropose a coverage metric and a two-pass test generation method for path delay faults in combinational logic circuits. The coverage is measured for each line with a rising and ...