4299 search results - page 213 / 860 » Concurrent Test Generation |
118
click to vote
DSD
2007
IEEE
15 years 10 months ago
2007
IEEE
In this paper, the methodology for automated design of checker for communication protocol testing is presented. Based on the level of checking, different design strategies can be ...
162
click to vote
PKC
2001
Springer
15 years 8 months ago
2001
Springer
Abstract. We describe a new general method to perform part of the setup stage of the XTR system introduced at Crypto 2000, namely finding the trace of a generator of the XTR group...
141
click to vote
IASTEDSE
2004
15 years 5 months ago
2004
Pairwise coverage of factors affecting software has been proposed to screen for potential errors. Techniques to generate test suites for pairwise coverage are evaluated according ...
112
click to vote
DATE
2004
IEEE
15 years 7 months ago
2004
IEEE
This paper presents 3LSSD, a novel, easilyautomatable approach for scan insertion and ATPG of asynchronous circuits. 3LSSD inserts scan latches only into global circuit feedback p...
128
click to vote
LREC
2008
15 years 5 months ago
2008
Evaluating the output of NLG systems is notoriously difficult, and performing assessments of text quality even more so. A range of automated and subject-based approaches to the ev...