4299 search results - page 226 / 860 » Concurrent Test Generation |
150
Voted
DATE
2002
IEEE
15 years 9 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
117
click to vote
ESE
2006
15 years 4 months ago
2006
This research addresses the problem of statically analyzing input command syntax as defined in interface and requirements specifications and then generating test cases for dynamic ...
147
click to vote
ASPDAC
2009
ACM
15 years 10 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
129
click to vote
APSEC
2006
IEEE
15 years 10 months ago
2006
IEEE
Testing for time-related behaviors of PLC software is important and should be performed carefully. We propose a structural testing technique on Function Block Diagram(FBD) network...
136
Voted
QSIC
2005
IEEE
15 years 9 months ago
2005
IEEE
This paper proposes a stochastic voting for testing a large number of Web Services (WS) under group testing. In the future, a large number of WS will be available and they need to...