4299 search results - page 227 / 860 » Concurrent Test Generation |
130
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COMPSAC
2003
IEEE
15 years 9 months ago
2003
IEEE
Usual techniques for automatic test data generation are based on the assumption that a complete oracle will be available during the testing process. However, there are programs fo...
131
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ATS
1998
IEEE
15 years 8 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
120
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EMSOFT
2006
Springer
15 years 7 months ago
2006
Springer
A key problem for effective unit testing is the difficulty of partitioning large software systems into appropriate units that can be tested in isolation. We present an approach th...
152
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DFT
2006
IEEE
15 years 6 months ago
2006
IEEE
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
163
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ICWS
2010
IEEE
15 years 5 months ago
2010
IEEE
This paper presents a methodology and a set of tools for the modelling, validation and testing of Web service composition, conceived and developed within the French national projec...