4299 search results - page 251 / 860 » Concurrent Test Generation |
141
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FASE
2010
Springer
15 years 11 months ago
2010
Springer
We introduce a technique for debugging multi-threaded C programs and analyzing the impact of source code changes, and its implementation in the prototype tool Direct. Our approach ...
147
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ICSE
1998
IEEE-ACM
15 years 8 months ago
1998
IEEE-ACM
The design, implementation, and testing of virtual environments is complicated by the concurrency and realtime features of these systems. Therefore, the development of formal meth...
155
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AUTONOMICS
2008
ACM
15 years 6 months ago
2008
ACM
Future space missions such as the Mars Science Laboratory demand the engineering of some of the most complex manrated autonomous software systems. According to some recent estimat...
140
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CONCURRENCY
2007
15 years 4 months ago
2007
OpenMP has gained wide popularity as an API for parallel programming on shared memory and distributed shared memory platforms. Despite its broad availability, there remains a need ...
123
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CEC
2005
IEEE
15 years 9 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...