4299 search results - page 260 / 860 » Concurrent Test Generation |
120
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ATS
2003
IEEE
15 years 9 months ago
2003
IEEE
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
145
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ICCD
2003
IEEE
15 years 9 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
116
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MSE
2003
IEEE
15 years 9 months ago
2003
IEEE
A tool has been developed to automate the testing and grading of design projects implemented in reprogrammable hardware. The server allows multiple students to test circuits in FP...
ITC
2000
IEEE
15 years 8 months ago
2000
IEEE
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
109
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DAC
1996
ACM
15 years 8 months ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...