4299 search results - page 288 / 860 » Concurrent Test Generation |
127
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DELTA
2004
IEEE
15 years 8 months ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
140
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IEE
2010
15 years 3 months ago
2010
Popular code coverage measures, such as branch coverage, are indicators of the thoroughness rather than the fault detection capability of test suites. Mutation testing is a fault-...
125
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ICSE
2007
IEEE-ACM
16 years 4 months ago
2007
IEEE-ACM
Policy testing and analysis are important techniques for high assurance of correct specification of access control policies. We propose a set of testing and analysis techniques fo...
157
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ICST
2008
IEEE
15 years 11 months ago
2008
IEEE
Intuition suggests that random testing of object-oriented programs should exhibit a high difference in the number of defects detected by two different runs over the same amount of...
133
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EMSOFT
2005
Springer
15 years 10 months ago
2005
Springer
Interrupt-driven embedded software is hard to thoroughly test since it usually contains a very large number of executable paths. Developers can test more of these paths using rand...