Sciweavers

4299 search results - page 559 / 860
» Concurrent Test Generation
Sort
View
ICML
2009
IEEE
15 years 11 months ago
Learning linear dynamical systems without sequence information
Virtually all methods of learning dynamic systems from data start from the same basic assumption: that the learning algorithm will be provided with a sequence, or trajectory, of d...
Tzu-Kuo Huang, Jeff Schneider
SAC
2009
ACM
15 years 11 months ago
Lightweight monitoring of sensor software
Wireless sensors are very small computers, and understanding the timing and behavior of software written for them is crucial to ensuring that they perform correctly. This paper ou...
Mustafa Hammad, Jonathan Cook
DATE
2009
IEEE
120views Hardware» more  DATE 2009»
15 years 11 months ago
Overcoming limitations of the SystemC data introspection
—Today verification, testing and debugging of SystemC models can be applied at an early stage in the design process. To support these techniques gaining required information of ...
Christian Genz, Rolf Drechsler
DDECS
2009
IEEE
128views Hardware» more  DDECS 2009»
15 years 11 months ago
A fast untestability proof for SAT-based ATPG
—Automatic Test Pattern Generation (ATPG) based on Boolean satisfiability (SAT) has been shown to be a beneficial complement to traditional ATPG techniques. Boolean solvers wor...
Daniel Tille, Rolf Drechsler
ICASSP
2009
IEEE
15 years 11 months ago
Scalable superwideband extension for wideband coding
Recent trends in speech and audio codec standardization include scalability and extending the signal bandwidth beyond wideband (WB) to superwideband (SWB). In this paper we introd...
Mikko Tammi, Lasse Laaksonen, Anssi Rämö...