1944 search results - page 28 / 389 » Coupling-based Integration Testing |
123
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DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
136
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ET
2002
15 years 4 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...
127
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OOPSLA
2007
Springer
15 years 10 months ago
2007
Springer
This article describes the design and use of the CUTE C++ testing framework and its integration into the Eclipse C++ Development Tooling. Unit testing supports code quality and is...
119
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GLVLSI
2003
IEEE
15 years 9 months ago
2003
IEEE
The current trends in high performance integrated circuits are towards faster and more powerful circuits in the giga-hertz range and even further. As the more complex Integrated C...