1518 search results - page 102 / 304 » Cryptographic Test Correction |
107
Voted
KBSE
2009
IEEE
15 years 10 months ago
2009
IEEE
Advances in recent years have made it possible in some cases to locate a bug (the source of a failure) automatically. But debugging is also about correcting bugs. Can tools do thi...
227
click to vote
DSN
2000
IEEE
15 years 8 months ago
2000
IEEE
We describe and test a software approach to overcoming radiation-induced errors in spaceborne applications running on commercial off-the-shelf components. The approach uses checks...
137
Voted
DAC
1999
ACM
15 years 8 months ago
1999
ACM
As the family of Alpha microprocessors continues to scale into more advanced technologies with very high frequency edge rates and multiple layers of interconnect, the issue of cha...
141
Voted
VLSID
2000
IEEE
15 years 7 months ago
2000
IEEE
We address the problem of verifying the correctness of pre-silicon models of a microprocessor. We touch on the latest advances in this area by considering two different aspects of...
144
Voted
DAC
1994
ACM
15 years 7 months ago
1994
ACM
-- In previous work, Hu and Dill identified a common cause of BDD-size blowup in high-level design verification and proposed the method of implicitly conjoined invariants to addres...