-- Noise in deep submicron technology combined with the move towards dynamic circuit techniques for higher performance have raised concerns about reliability and energyefficiency o...
The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, u...
Todd M. Austin, Valeria Bertacco, David Blaauw, Tr...
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
The deep submicron (DSM) semiconductor technologies will make the worst-case design impossible, since they can not provide design margins that it requires. Research directions sho...