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» Design Rewiring Using ATPG
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80
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DAC
2007
ACM
16 years 19 days ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
VLSID
2002
IEEE
107views VLSI» more  VLSID 2002»
16 years 2 hour ago
Estimation of Maximum Power-Up Current
Power gating is emerging as a viable solution to reduction of leakage current. However, power gated circuits are different from the conventional designs in the sense that a power-...
Fei Li, Lei He, Kewal K. Saluja
105
Voted
TC
1998
14 years 11 months ago
Abstraction Techniques for Validation Coverage Analysis and Test Generation
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
DFT
2006
IEEE
203views VLSI» more  DFT 2006»
15 years 5 months ago
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
Ondrej Novák, Zdenek Plíva, Jiri Jen...
85
Voted
DAC
1999
ACM
15 years 4 months ago
Microprocessor Based Testing for Core-Based System on Chip
The purpose of this paper is to develop a exible design for test methodology for testing a core-based system on chip SOC. The novel feature of the approach is the use an embedde...
Christos A. Papachristou, F. Martin, Mehrdad Noura...