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DFT
2008
IEEE
138views VLSI» more  DFT 2008»
15 years 4 months ago
Exploring Density-Reliability Tradeoffs on Nanoscale Substrates: When do smaller less reliable devices make sense?
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...
Andrey V. Zykov, Gustavo de Veciana
DSD
2011
IEEE
194views Hardware» more  DSD 2011»
13 years 9 months ago
Reliability-Aware Design Optimization for Multiprocessor Embedded Systems
—This paper presents an approach for the reliability-aware design optimization of real-time systems on multi-processor platforms. The optimization is based on an extension of wel...
Jia Huang, Jan Olaf Blech, Andreas Raabe, Christia...
78
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ISCA
2007
IEEE
120views Hardware» more  ISCA 2007»
15 years 3 months ago
Examining ACE analysis reliability estimates using fault-injection
ACE analysis is a technique to provide an early reliability estimate for microprocessors. ACE analysis couples data from performance models with low level design details to identi...
Nicholas J. Wang, Aqeel Mahesri, Sanjay J. Patel
DAC
2009
ACM
15 years 2 months ago
Vicis: a reliable network for unreliable silicon
Process scaling has given designers billions of transistors to work with. As feature sizes near the atomic scale, extensive variation and wearout inevitably make margining unecono...
David Fick, Andrew DeOrio, Jin Hu, Valeria Bertacc...
GECCO
2007
Springer
164views Optimization» more  GECCO 2007»
15 years 3 months ago
Is the island model fault tolerant?
In this paper, we present a study on the fault tolerance nature of the island model when applied to Genetic Algorithms. Parallel and distributed models have been extensively appli...
José Ignacio Hidalgo, Juan Lanchares, Franc...