49 search results - page 5 / 10 » Design fault directed test generation for microprocessor val... |
GLVLSI
2008
IEEE
15 years 6 months ago
2008
IEEE
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
74
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AUTOMATICA
2006
14 years 11 months ago
2006
Given a number of possibly concurrent faults (and disturbances) that may affect a nonlinear dynamic system, it may not be possible to solve the standard fault detection and isolat...
ASPLOS
2006
ACM
15 years 5 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
ISVLSI
2007
IEEE
15 years 5 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
105
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RTAS
2009
IEEE
15 years 6 months ago
2009
IEEE
Embedded systems in safety-critical environments demand safety guarantees while providing many useful services that are too complex to formally verify or fully test. Existing appl...