10533 search results - page 103 / 2107 » Design in reliability for communication designs |
SIGCOMM
2009
ACM
15 years 4 months ago
2009
ACM
We describe a new model for studying intermittently connected mobile networks, based on Markovian random temporal graphs, that captures the influence of message size, maximum tol...
SIGCOMM
2009
ACM
15 years 4 months ago
2009
ACM
In this paper, we describe the opportunistic localization, which enables localization services that works seamlessly in heterogeneous environments including indoors as oppose to G...
MATA
2005
Springer
15 years 3 months ago
2005
Springer
Widget Integration Framework (WIF) is a framework that covers diverse widgets and their interactions with higher layers above. The framework everal advantages of supporting a progr...
DAC
2004
ACM
15 years 11 months ago
2004
ACM
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
DAC
1996
ACM
15 years 2 months ago
1996
ACM
Hot-carrier eects and electromigration are the two important failure mechanisms that signi cantly impact the long-term reliability of high-density VLSI ICs. In this paper, we prese...