—Large, reliable and efficient storage systems are becoming increasingly important in enterprise environments. Our research in storage system design is oriented towards the expl...
George Parissis, George Xylomenos, Theodore K. Apo...
This work is motivated by the strong demand of reliability enhancement over flash memory. Our objective is to improve the endurance of flash memory with limited overhead and witho...
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
—In the context of vehicular safety and entertainment applications, we focus on the design of a reliable medium access control scheme. Each vehicle is willing to form a network a...