10533 search results - page 145 / 2107 » Design in reliability for communication designs |
AICCSA
2008
IEEE
14 years 12 months ago
2008
IEEE
Nanodevices based circuit design will be based on the acceptance that a high percentage of devices in the design will be defective. In this work, we investigate a defect tolerant ...
MICRO
2009
IEEE
15 years 4 months ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
SENSYS
2009
ACM
15 years 4 months ago
2009
ACM
Network protocols are typically designed and tested individually. In practice, however, applications use multiple protocols concurrently. This discrepancy can lead to failures fro...
DAC
2008
ACM
15 years 11 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
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ISCA
2012
IEEE
13 years 16 days ago
2012
IEEE
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...