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DFT
2008
IEEE
117views VLSI» more  DFT 2008»
16 years 15 days ago
Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
Vikas Chandra, Robert C. Aitken
RAM
2008
IEEE
163views Robotics» more  RAM 2008»
16 years 12 days ago
Reactive Gaze Control for Natural Human-Robot Interactions
Abstract—Nonverbal behavior during human-human close encounters is critical to the accomplishment of natural interaction. For this reason, humanoid robots trying to achieve natur...
Yasser F. O. Mohammad, Toyoaki Nishida
ICNP
2007
IEEE
16 years 10 days ago
Network-based and Attack-resilient Length Signature Generation for Zero-day Polymorphic Worms
—It is crucial to detect zero-day polymorphic worms and to generate signatures at the edge network gateways or honeynets so that we can prevent the worms from propagating at thei...
Zhichun Li, Lanjia Wang, Yan Chen, Zhi Fu
INFOCOM
2007
IEEE
16 years 10 days ago
Performance Evaluation of Loss Networks via Factor Graphs and the Sum-Product Algorithm
— Loss networks provide a powerful tool for the analysis and design of many communication and networking systems. It is well known that a large number of loss networks have produ...
Jian Ni, Sekhar Tatikonda
INFOCOM
2007
IEEE
16 years 10 days ago
Finding Self-Similarities in Opportunistic People Networks
— Opportunistic network is a type of Delay Tolerant Networks (DTN) where network communication opportunities appear opportunistic. In this study, we investigate opportunistic net...
Ling-Jyh Chen, Yung-Chih Chen, Tony Sun, Paruvelli...