701 search results - page 79 / 141 » Design patterns for lazy evaluation |
129
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DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
102
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MCS
2001
Springer
15 years 4 months ago
2001
Springer
Abstract. Given an arbitrary data set, to which no particular parametrical, statistical or geometrical structure can be assumed, different clustering algorithms will in general pr...
MCS
2001
Springer
15 years 4 months ago
2001
Springer
One of the main factors affecting the effectiveness of ECOC methods for classification is the dependence among the errors of the computed codeword bits. We present an extensive ...
103
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ATS
2000
IEEE
15 years 4 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
MASCOTS
2001
15 years 1 months ago
2001
While there are different research groups in the mobile computing community, most research requires mobile action data in terms of user calling and mobility patterns. Since collec...