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ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
15 years 9 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
CGVR
2006
15 years 7 months ago
Evolutionary Design of Virtual Plants
- This paper presents a technique of evolutionary design for plants in virtual worlds, inspired from Richard Dawkins' adaptive walks within the space of biomorph structures. T...
Stefan Bornhofen, Claude Lattaud
SLIP
2009
ACM
16 years 1 days ago
Is overlay error more important than interconnect variations in double patterning?
Double patterning lithography seems to be a prominent choice for 32nm and 22nm technologies. Double patterning lithography techniques require additional masks for a single interco...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...
ICPR
2006
IEEE
15 years 11 months ago
Multiscale Feature Extraction of Finger-Vein Patterns Based on Curvelets and Local Interconnection Structure Neural Network
In this paper, we originally propose a multiscale feature extraction method of finger-vein patterns based on curvelets and local interconnection structure neural networks. The cur...
Zhongbo Zhang, Siliang Ma, Xiao Han
ER
2000
Springer
139views Database» more  ER 2000»
15 years 9 months ago
Semantic Analysis Patterns
The development of object-oriented software starts from requirements expressed commonly as Use Cases. The requirements are then converted into a conceptual or analysis model. Analy...
Eduardo B. Fernández, Xiaohong Yuan