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» Deterministic BIST with Partial Scan
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ET
2000
73views more  ET 2000»
14 years 10 months ago
Deterministic BIST with Partial Scan
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
Gundolf Kiefer, Hans-Joachim Wunderlich
ITC
1998
IEEE
77views Hardware» more  ITC 1998»
15 years 3 months ago
Deterministic BIST with multiple scan chains
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simu...
Gundolf Kiefer, Hans-Joachim Wunderlich
94
Voted
ITC
1995
IEEE
95views Hardware» more  ITC 1995»
15 years 2 months ago
Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST
Kwang-Ting Cheng, Chih-Jen Lin
ET
2002
111views more  ET 2002»
14 years 10 months ago
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wun...