Abstract—This paper presents a high-speed digital feedforward Delta-Sigma Modulator which relaxes timing requirement for the Dynamic Element Matching (DEM) algorithm. By making t...
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
Over the past decade, digital signal processors (DSPs) have emerged as the processors of choice for implementing embedded applications in high-volume consumer products. Through th...
Although retargetability has been a major design concern for many compilers, retargetability is a vitally important issue for Digital Signal Processors(DSPs) because the architect...
— A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for...