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DAC
2004
ACM
15 years 3 months ago
Parametric yield estimation considering leakage variability
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
Rajeev R. Rao, Anirudh Devgan, David Blaauw, Denni...
KDD
2000
ACM
101views Data Mining» more  KDD 2000»
15 years 1 months ago
Incremental quantile estimation for massive tracking
Data--call records, internet packet headers, or other transaction records--are coming down a pipe at a ferocious rate, and we need to monitor statistics of the data. There is no r...
Fei Chen, Diane Lambert, José C. Pinheiro
DFT
2007
IEEE
142views VLSI» more  DFT 2007»
15 years 4 months ago
Quantitative Analysis of In-Field Defects in Image Sensor Arrays
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...
Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israe...
CVPR
2012
IEEE
13 years 4 days ago
Bag of textons for image segmentation via soft clustering and convex shift
We propose an unsupervised image segmentation method based on texton similarity and mode seeking. The input image is first convolved with a filter-bank, followed by soft cluster...
Zhiding Yu, Ang Li, Oscar C. Au, Chunjing Xu
IPPS
2007
IEEE
15 years 4 months ago
Probability Convergence in a Multithreaded Counting Application
The problem of counting specified combinations of a given set of variables arises in many statistical and data mining applications. To solve this problem, we introduce the PDtree...
Chad Scherrer, Nathaniel Beagley, Jarek Nieplocha,...