In this paper, we propose a fault-tolerant mechanism for microprocessors, which detects transient faults and recovers from them. There are two driving force to investigate fault-t...
Recent software systems usually feature an automated failure reporting component, with which a huge number of failures are collected from software end-users. With a proper support...
Many time series exhibit dynamics over vastly different time scales. The standard way to capture this behavior is to assume that the slow dynamics are a “trend”, to de-trend t...
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...
The aim of passive testing is to detect faults in a system while observing the system during normal operation, that is, without forcing the system to specialized inputs explicitly ...
Arun N. Netravali, Krishan K. Sabnani, Ramesh Visw...