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DAC
2007
ACM
15 years 11 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
IEEEPACT
2005
IEEE
15 years 3 months ago
Instruction Based Memory Distance Analysis and its Application
Feedback-directed Optimization has become an increasingly important tool in designing and building optimizing compilers as itprovides a means to analyze complexprogram behavior th...
Changpeng Fang, Steve Carr, Soner Önder, Zhen...
ICWN
2004
14 years 11 months ago
Does Cluster Architecture Enhance Performance Scalability of Clustered Mobile Ad Hoc Networks?
This paper explains and evaluates the performance of a cluster architecture-based routing protocol, called Link Cluster Protocol (LCP), in mobile ad hoc networks (MANETs). LCP show...
Myeong L. Lim, Chansu Yu
ALMOB
2006
113views more  ALMOB 2006»
14 years 10 months ago
Inverse bifurcation analysis: application to simple gene systems
Background: Bifurcation analysis has proven to be a powerful method for understanding the qualitative behavior of gene regulatory networks. In addition to the more traditional for...
James Lu, Heinz W. Engl, Peter Schuster
CCS
2006
ACM
15 years 1 months ago
Measuring denial Of service
Denial-of-service (DoS) attacks significantly degrade service quality experienced by legitimate users by introducing long delays, excessive losses, and service interruptions. The ...
Jelena Mirkovic, Peter L. Reiher, Sonia Fahmy, Ros...