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81
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VTS
2005
IEEE
95views Hardware» more  VTS 2005»
15 years 3 months ago
SRAM Retention Testing: Zero Incremental Time Integration with March Algorithms
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
Baosheng Wang, Yuejian Wu, Josh Yang, André...
SIGCSE
2005
ACM
366views Education» more  SIGCSE 2005»
15 years 3 months ago
Using asynchronous discussions to enhance student participation in CS courses
As Computer Science (CS) educators, we are involved in teaching a variety of undergraduate and graduate courses such as database management systems, networking, software developme...
Bhagyavati, Stan Kurkovsky, Christopher C. Whitehe...
97
Voted
IEAAIE
2004
Springer
15 years 3 months ago
Machine Learning Approaches for Inducing Student Models
The main issue in e-learning is student modelling, i.e. the analysis of a student’s behaviour and prediction of his/her future behaviour and learning performance. Indeed, it is d...
Oriana Licchelli, Teresa Maria Altomare Basile, Ni...
88
Voted
ICDCSW
2003
IEEE
15 years 3 months ago
Scaling Server Selection Using a Multi-Broker Architecture
Server replication is a common approach to improving the scalability of a service on the Internet. For this approach, the task of finding an appropriate server from a set of repli...
Mohamed-Vall O. Mohamed-Salem, Gregor von Bochmann...
116
Voted
DATE
2010
IEEE
161views Hardware» more  DATE 2010»
15 years 3 months ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich