275 search results - page 9 / 55 » Efficient Identification of Design Patterns with Bit-vector ... |
DASC
2006
IEEE
15 years 3 months ago
2006
IEEE
Run-time monitoring is a powerful approach for dynamically detecting faults or malicious activity of software systems. However, there are often two obstacles to the implementation...
VLSID
2008
IEEE
15 years 12 months ago
2008
IEEE
In the automatic design of custom instruction set processors, there can be a very large set of potential custom instructions, from which a few instructions are required to be chos...
KDD
1999
ACM
15 years 3 months ago
1999
ACM
We introduce a new kind of patterns, called emerging patterns (EPs), for knowledge discovery from databases. EPs are defined as itemsets whose supports increase significantly from...
DAC
2009
ACM
16 years 17 days ago
2009
ACM
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
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DAC
2003
ACM
15 years 4 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...