Sciweavers

4192 search results - page 142 / 839
» Efficient testing of groups
Sort
View
121
Voted
EURODAC
1990
IEEE
92views VHDL» more  EURODAC 1990»
15 years 4 months ago
Accelerated test pattern generation by cone-oriented circuit partitioning
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
Torsten Grüning, Udo Mahlstedt, Wilfried Daeh...
PTS
2008
98views Hardware» more  PTS 2008»
15 years 2 months ago
Modular System Verification by Inference, Testing and Reachability Analysis
Verification of a modular system composed of communicating components is a difficult problem, especially when the models of the components are not available. Conventional testing t...
Roland Groz, Keqin Li 0002, Alexandre Petrenko, Mu...
92
Voted
ET
2002
97views more  ET 2002»
15 years 16 days ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
85
Voted
JMLR
2010
101views more  JMLR 2010»
14 years 7 months ago
Efficient Reductions for Imitation Learning
Imitation Learning, while applied successfully on many large real-world problems, is typically addressed as a standard supervised learning problem, where it is assumed the trainin...
Stéphane Ross, Drew Bagnell
DDECS
2006
IEEE
101views Hardware» more  DDECS 2006»
15 years 6 months ago
Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...
Guoyan Zhang, Ronan Farrell