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SIGPLAN
2002
15 years 13 days ago
Embedding built-in tests in hot spots of an object-oriented framework
: Object-oriented frameworks require thorough testing as they are intended to be reused repeatedly in developing numerous applications. Moreover, whenever a framework is extended f...
Taewoong Jeon, Hyonwoo Seung, Sungyoung Lee
SIGSOFT
2005
ACM
16 years 1 months ago
CUTE: a concolic unit testing engine for C
In unit testing, a program is decomposed into units which are collections of functions. A part of unit can be tested by generating inputs for a single entry function. The entry fu...
Koushik Sen, Darko Marinov, Gul Agha
91
Voted
DAC
2005
ACM
15 years 2 months ago
Path delay test compaction with process variation tolerance
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T...
70
Voted
DAC
2009
ACM
16 years 1 months ago
On systematic illegal state identification for pseudo-functional testing
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
Feng Yuan, Qiang Xu
DFT
2009
IEEE
189views VLSI» more  DFT 2009»
15 years 7 months ago
Analyzing Formal Verification and Testing Efforts of Different Fault Tolerance Mechanisms
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
Meng Zhang, Anita Lungu, Daniel J. Sorin